SWIR
Adaptive Lighting’s Shortwave Infra Red (SWIR) lighting systems includes wavelengths between 700nm and 1650nm. Materials inspected by SWIR absorb, transmit or reflect light differently depending on the wavelength involved. Capturing images at these wavelengths provides vivid and measurable contrast of the subject under investigation revealing defects not detectable under visible wavelength conditions. This method can be used in a wide variety of applications ranging from wafer and solar cell inspection, food, beverage, security and surveillance.
